Sfoglia per Autore
IMPROVEMENTS TO NUMERICAL TESTABILITY EVALUATION.
1987 Catelani M.; Iuculano G.; Liberatore A.; Manetti S.; Marini M.
Back projection reconstruction of the ultrasound field for the 3-D view in the robotic applications.
1990 E. Biagi; M. Catelani; G. Iuculano; S. Rocchi; A. Zanini
ANALOG NETWORK TESTABILITY MEASUREMENT - A SYMBOLIC FORMULATION APPROACH
1991 CARMASSI R.; CATELANI M.; IUCULANO G.; LIBERATORE A.; MANETTI S.; MARINI M.
Recursive random-sampling strategy for a digital wattmeter
1992 F.Filicori; G.Iuculano; D.Mirri; A.Menchetti; M.Catelani
Sequential life tests for the four-parameter generalized Gamma distribution
1993 G.IUCULANO; M. CATELANI; A.ZANOBINI
On the application of neural networks to fault diagnosis of electronic analog circuit
1996 M.Catelani; M.Gori
A new symbolic approach to the fault diagnosis of analog circuits
1996 M. Catelani;G. Fedi;S. Giraldi;A. Luchetta;S. Manetti;M.C. Piccirilli
A new symbolic approach for testability measurement of analog networks
1996 M. Catelani;G. Fedi;A. Luchetta;S. Manetti;M. Marini;M.C. Piccirilli
AVAILABILITY ANALYSIS AND EVALUATION FOR ELECTRONIC COMPLEX SYSTEMS WITH SEMI-MARKOV MODELS
1997 G. PELLEGRINI; M. CATELANI; G. IUCULANO; A. ZANOBINI
A fully automated measurement system for the fault diagnosis of analog electronic circuits
1997 M. Catelani; G. Fedi; S. Giraldi; A. Luchetta; S. Manetti; M. C. Piccirilli
Measurement of the availability performance for electronic complex systems
1998 G. Pellegrini; G. Iuculano; M. Catelani
A measurement system for fault detection and fault isolation of analog circuits
1999 M.Catelani; S.Giraldi
Effects of Test Sequencies on the Degradation Analysis in High Speed Connectors
2000 M. CATELANI; M.MUGNAINI; R.SINGUAROLI
Soft fault diagnosis in analogue circuits: A comparison of fuzzy approach with radial basis function networks
2000 Catelani, Marcantonio; Fort, Ada; Bigi, Michele; Singuaroli, Roberto
Fault diagnosis of electronic analog circuits using a radial basis function network classifier
2000 M.Catelani; A.Fort
Automatic measurement system for degradation analysis in thin-film AlCu metallizations
2000 Catelani, M; Nicoletti, R.
Reliability tests for thermal aging of thin-film AlCu metallizations
2001 Catelani, M; Nicoletti, R.
Soft fault diagnosis in analog electronic circuits: Sensitivity analysis by randomized algorithms
2001 Alippi, C; Catelani, M.; Fort, A.
Soft Fault Detection and Islation in Analog Circuits: Some Results and a Comparison Between a Fuzzy Approach and Radial Basis Function Network
2002 M. CATELANI; A.FORT
SBT Soft Fault Diagnosis in Analog Electronic Circuits: a Sensitivity-Based Approach By Randomized Algorithms
2002 C.ALIPPI; M. CATELANI; A.FORT; M.MUGNAINI
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