This paper addresses the problem of automated fault diagnosis in analog electronic circuits, based on Simulation Before Test techniques. The diagnosis is obtained by comparing the faulty circuit signature with a set of examples contained in a fault dictionary. A method for improving the fault dictionary is presented, based on a global sensitivity analysis method and on a fuzzy processing method applied to the obtained sensitivity curves.

Automatic selection of test frequencies for the diagnosis of soft faults in analog circuits / Alippi, C; Catelani, M.; Fort, A.; Mugnaini, M.. - STAMPA. - 2:(2002), pp. 1503-1508. (Intervento presentato al convegno 19th IEEE Intrumentation and Measurement Technology Conference tenutosi a Anchorage, AK, usa nel 2002).

Automatic selection of test frequencies for the diagnosis of soft faults in analog circuits

CATELANI, MARCANTONIO;
2002

Abstract

This paper addresses the problem of automated fault diagnosis in analog electronic circuits, based on Simulation Before Test techniques. The diagnosis is obtained by comparing the faulty circuit signature with a set of examples contained in a fault dictionary. A method for improving the fault dictionary is presented, based on a global sensitivity analysis method and on a fuzzy processing method applied to the obtained sensitivity curves.
2002
Conference Record - IEEE Instrumentation and Measurement Technology Conference
19th IEEE Intrumentation and Measurement Technology Conference
Anchorage, AK, usa
2002
Alippi, C; Catelani, M.; Fort, A.; Mugnaini, M.
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/1050215
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