Hysteresis Models of Dynamic Mode Atomic Force Microscopes: Analysis and Identification via Harmonic Balance

A new class of models based on hysteresis functions is developed to describe the operation of dynamic mode atomic force microscopy. Such models can account for dissipative phenomena affecting the interaction between the probe and the sample. The model analysis, which is developed using frequency domain techniques, provides a insights into experimentally observed behavior. Experimental data corroborates the models developed.