The paper deals with harmonic balance analysis of tapping mode atomic force microscopes. The separation-amplitude curve is analytically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.
Frequency Analysis of Atomic Force Microscopes with Repulsive-Attractive Interaction Potentials / D. MATERASSI; M. BASSO; R. GENESIO. - ELETTRONICO. - (2004), pp. 0-0. (Intervento presentato al convegno IEEE Conference on Decision and Control tenutosi a Paradise Island (Bahamas), 2004 nel 2004) [10.1109/CDC.2004.1428934].
Frequency Analysis of Atomic Force Microscopes with Repulsive-Attractive Interaction Potentials
MATERASSI, DONATELLO;BASSO, MICHELE;GENESIO, ROBERTO
2004
Abstract
The paper deals with harmonic balance analysis of tapping mode atomic force microscopes. The separation-amplitude curve is analytically evaluated for a large class of common tip-sample interaction potentials. The proposed approach provides an useful insight of many nonlinear known phenomena with respect to fully numerical approaches.
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