IEEE Journals & Magazines Save to Project icon | Click to Close Quick AbstractQuick Abstract | PDF file iconPDF (526 KB) A technique to characterize homogeneous and inhomogeneous dielectric materials based on measurements and computations is presented. The first step of the method proposed consists of measuring the resonant frequencies of an arbitrarily shaped cavity containing an arbitrarily shaped sample of the material under test. In the second step, the measured data are used in two different algorithms, both based on the finite-element method, to solve for the dielectric constant
Characterization of dielectric materials with the finite element method / R. Coccioli; G. Pelosi; S. Selleri. - In: IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. - ISSN 0018-9480. - STAMPA. - 47:(1999), pp. 1106-1112. [10.1109/22.775443]
Characterization of dielectric materials with the finite element method
PELOSI, GIUSEPPE;SELLERI, STEFANO
1999
Abstract
IEEE Journals & Magazines Save to Project icon | Click to Close Quick AbstractQuick Abstract | PDF file iconPDF (526 KB) A technique to characterize homogeneous and inhomogeneous dielectric materials based on measurements and computations is presented. The first step of the method proposed consists of measuring the resonant frequencies of an arbitrarily shaped cavity containing an arbitrarily shaped sample of the material under test. In the second step, the measured data are used in two different algorithms, both based on the finite-element method, to solve for the dielectric constant
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