In the last years several hundreds of large (∼25 cm2) double-sided silicon strip detectors have been designed and tested in our Pisa-INFN laboratory. These detectors are currently used in ALEPH and L3 vertices, and in other field of applications as well. We present the tests performed on a single detector, and we discuss some results on the test structures inserted in each wafer in order to measure the relevant, process-dependent, quantities which determine the detector performances.

Double-sided silicon strip detectors in Pisa / G. Batignani;L. Bosisio;E. Focardi;F. Forti;M. Giorgi;D. Marangoni;G. Rizzo;G. Tonelli;G. Triggiani. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - ELETTRONICO. - 360:(1995), pp. 98-102. [10.1016/0168-9002(94)01225-3]

Double-sided silicon strip detectors in Pisa

FOCARDI, ETTORE;
1995

Abstract

In the last years several hundreds of large (∼25 cm2) double-sided silicon strip detectors have been designed and tested in our Pisa-INFN laboratory. These detectors are currently used in ALEPH and L3 vertices, and in other field of applications as well. We present the tests performed on a single detector, and we discuss some results on the test structures inserted in each wafer in order to measure the relevant, process-dependent, quantities which determine the detector performances.
1995
360
98
102
G. Batignani;L. Bosisio;E. Focardi;F. Forti;M. Giorgi;D. Marangoni;G. Rizzo;G. Tonelli;G. Triggiani
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/638346
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