Thermally stimulated current measurement of neutron irradiated silicon detectors have been performed. Several energy levels have been observed, revealing in particular the presence of the vacancy-oxygen complex (A center) in its double configuration, the divacancy in single (V2-) and double (V2--) minus charge state and the vacancy-phosphorous complex (E center). The increase of the leakage current of the irradiated diodes seems to be caused mainly by the presence of the E and V2- defects. The E centers give the main contribution to this effect, nearly 25 times higher than the V2- one, while the current terms related to the other defects are almost irrelevant in the generation of the total leakage current of the device. A general agreement with leakage current constant measurements and annealing behaviours has been observed.
THERMALLY STIMULATED AND LEAKAGE CURRENT ANALYSIS OF NEUTRON-IRRADIATED SILICON DETECTORS / E. BORCHI;M. BRUZZI; M.S. MAZZONI. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - STAMPA. - 310:(1991), pp. 273-276. [10.1016/0168-9002(91)91042-T]
THERMALLY STIMULATED AND LEAKAGE CURRENT ANALYSIS OF NEUTRON-IRRADIATED SILICON DETECTORS
BORCHI, EMILIO;BRUZZI, MARA;
1991
Abstract
Thermally stimulated current measurement of neutron irradiated silicon detectors have been performed. Several energy levels have been observed, revealing in particular the presence of the vacancy-oxygen complex (A center) in its double configuration, the divacancy in single (V2-) and double (V2--) minus charge state and the vacancy-phosphorous complex (E center). The increase of the leakage current of the irradiated diodes seems to be caused mainly by the presence of the E and V2- defects. The E centers give the main contribution to this effect, nearly 25 times higher than the V2- one, while the current terms related to the other defects are almost irrelevant in the generation of the total leakage current of the device. A general agreement with leakage current constant measurements and annealing behaviours has been observed.File | Dimensione | Formato | |
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