A spectroheliograph dedicated to the observation of the solar disk in the extreme-ultraviolet OV spectral line at 62.97 nm is described. As demonstrated in the Skylab SO-82A spectroheliograph [Appl. Opt. 16, 870 (1977)], this line is uniquely suited to characterize solar plasma in the important 250,000 K temperature regime. No multilayer coating or suitable filter is yet available to select this wavelength, so an optical design based on a double spectrograph with a spatial filter to remove the unwanted radiation has been developed. Analysis of the optical design shows that this instrument can obtain a 1 arcsec spatial resolution (two pixels) with a relatively high image-acquisition cadence. A preliminary tolerance analysis has been performed. A simple method of instrument alignment in visible light is also described.

Optical design of a high-spatial-resolution extreme-ultraviolet spectroheliograph for the transition region / Giampiero Naletto;Silvano Fineschi;Ester Antonucci;Vania Da Deppo;Piergiorgio Nicolosi;Luca Zangrilli;Marco Romoli;Marco Malvezzi;Daniel Moses. - In: APPLIED OPTICS. - ISSN 1559-128X. - STAMPA. - 44:(2005), pp. 5046-5054. [10.1364/AO.44.005046]

Optical design of a high-spatial-resolution extreme-ultraviolet spectroheliograph for the transition region

ROMOLI, MARCO;
2005

Abstract

A spectroheliograph dedicated to the observation of the solar disk in the extreme-ultraviolet OV spectral line at 62.97 nm is described. As demonstrated in the Skylab SO-82A spectroheliograph [Appl. Opt. 16, 870 (1977)], this line is uniquely suited to characterize solar plasma in the important 250,000 K temperature regime. No multilayer coating or suitable filter is yet available to select this wavelength, so an optical design based on a double spectrograph with a spatial filter to remove the unwanted radiation has been developed. Analysis of the optical design shows that this instrument can obtain a 1 arcsec spatial resolution (two pixels) with a relatively high image-acquisition cadence. A preliminary tolerance analysis has been performed. A simple method of instrument alignment in visible light is also described.
2005
44
5046
5054
Giampiero Naletto;Silvano Fineschi;Ester Antonucci;Vania Da Deppo;Piergiorgio Nicolosi;Luca Zangrilli;Marco Romoli;Marco Malvezzi;Daniel Moses
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/778707
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