The paper proposes a novel approach to evaluate the measurement uncertainty of time domain dynamic parameters in Digital to Analog Converters (DACs). In particular, DAC rise time and fall time are taken into account and analyzed experimentally by means of dedicated measurement stations. The uncertainty of such measures is evaluated using the bootstrap method in order to define confidence intervals from short acquisition records without needing hypotheses about the measurand distribution. The final aim of this work is to give a contribution, in terms of uncertainty assessment, for the draft of IEEE Std.1658 concerning terminology and test methods for DACs.

Uncertainty evaluation of DAC time response parameters / Balestrieri E.; Catelani M.; Ciani L.; Rapuano S.; Zanobini A.. - STAMPA. - (2011), pp. 278-281. (Intervento presentato al convegno IMEKO TC4 International Workshop on ADC Modelling, Testing and Data Converter Analysis and Design 2011, IWADC 2011 and IEEE 2011 ADC Forum tenutosi a Orvieto (PG)).

Uncertainty evaluation of DAC time response parameters

CATELANI, MARCANTONIO;CIANI, LORENZO;ZANOBINI, ANDREA
2011

Abstract

The paper proposes a novel approach to evaluate the measurement uncertainty of time domain dynamic parameters in Digital to Analog Converters (DACs). In particular, DAC rise time and fall time are taken into account and analyzed experimentally by means of dedicated measurement stations. The uncertainty of such measures is evaluated using the bootstrap method in order to define confidence intervals from short acquisition records without needing hypotheses about the measurand distribution. The final aim of this work is to give a contribution, in terms of uncertainty assessment, for the draft of IEEE Std.1658 concerning terminology and test methods for DACs.
2011
Proceedings of IMEKO TC4 International Workshop on ADC Modelling, Testing and Data Converter Analysis and Design 2011
IMEKO TC4 International Workshop on ADC Modelling, Testing and Data Converter Analysis and Design 2011, IWADC 2011 and IEEE 2011 ADC Forum
Orvieto (PG)
Balestrieri E.; Catelani M.; Ciani L.; Rapuano S.; Zanobini A.
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/835696
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