This research was conducted with the aim of analyzing two of the main metrological characteristics of any measurement system: Repeatability and Reproducibility. Both of these features play an important role in the analysis of the measurements and they can give us a lot of information about who and what influences any measuring system. The analysis of Repeatability and Reproducibility is generally carried out through the use of the study Gage R&R. This study is very useful because it permits us to understand which are the decisive factors in a measurement system, and, definitively, if the process is stable, that is under statistical control or out of statistical control.

Repeatability and reproducibility techniques for measurement system analysis / M. Catelani;L. Ciani;B. Sereni;A. Zanobini. - STAMPA. - (2014), pp. 375-380. (Intervento presentato al convegno 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 tenutosi a Benevento (Italy) nel 2014).

Repeatability and reproducibility techniques for measurement system analysis

CATELANI, MARCANTONIO;CIANI, LORENZO;ZANOBINI, ANDREA
2014

Abstract

This research was conducted with the aim of analyzing two of the main metrological characteristics of any measurement system: Repeatability and Reproducibility. Both of these features play an important role in the analysis of the measurements and they can give us a lot of information about who and what influences any measuring system. The analysis of Repeatability and Reproducibility is generally carried out through the use of the study Gage R&R. This study is very useful because it permits us to understand which are the decisive factors in a measurement system, and, definitively, if the process is stable, that is under statistical control or out of statistical control.
2014
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014
Benevento (Italy)
2014
M. Catelani;L. Ciani;B. Sereni;A. Zanobini
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/955251
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