A deep-subwavelength imaging of the optical-guided modes localized in silicon microring resonators, obtained with a polarization-sensitive Fano-imaging technique, is demonstrated. We merge together near-field scanning optical microscopy and resonant forward scattering spectroscopy, leading to near-field hyperspectral imaging without the need of embedded light emitters or evanescent light coupling into the microring. The combined analysis of the observed Fano-like spectral line shapes and of the near-field intensity spatial distributions, supported by accurate numerical calculations, gives a clear discrimination between the TE and the TM modes.
Near-Field Fano-Imaging of TE and TM Modes in Silicon Microrings / La China, Federico; Intonti, Francesca; Caselli, Niccolò; Lotti, Francesco; Sarti, Francesco; Vinattieri, Anna; Noury, Adrien; Le Roux, Xavier; Zhang, Weiwei; Cassan, Eric; Ramos, Carlos Alonso; Valdeiglesias, Elena Durán; Izard, Nicolas; Vivien, Laurent; Gurioli, Massimo. - In: ACS PHOTONICS. - ISSN 2330-4022. - STAMPA. - 2:(2015), pp. 1712-1718. [10.1021/acsphotonics.5b00327]
Near-Field Fano-Imaging of TE and TM Modes in Silicon Microrings
LA CHINA, FEDERICO;INTONTI, FRANCESCA;CASELLI, NICCOLO';SARTI, FRANCESCO;VINATTIERI, ANNA;GURIOLI, MASSIMO
2015
Abstract
A deep-subwavelength imaging of the optical-guided modes localized in silicon microring resonators, obtained with a polarization-sensitive Fano-imaging technique, is demonstrated. We merge together near-field scanning optical microscopy and resonant forward scattering spectroscopy, leading to near-field hyperspectral imaging without the need of embedded light emitters or evanescent light coupling into the microring. The combined analysis of the observed Fano-like spectral line shapes and of the near-field intensity spatial distributions, supported by accurate numerical calculations, gives a clear discrimination between the TE and the TM modes.I documenti in FLORE sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.