The in-plane rotation of magnetic stripe domains in a 65-nm magnetostrictive Fe0.8Ga0.2 epitaxial film was investigated combining magnetic force microscopy, vibration sample magnetometry, and x-ray resonant magnetic scattering measurements.We analyzed the behavior of the stripe pattern under the application of a bias magnetic field along the in-plane direction perpendicular to the stripe axis, and made a comparison with the analogous behavior at remanence. The experimental results have been explained by means of micromagnetic simulations, supported by energy balance considerations. Fields smaller than ∼400 Oe do not induce any stripe rotation; rather, a deformation of the closure domains pattern was evidenced. Larger fields produce a sudden rotation of the stripe structure.

In-plane rotation of magnetic stripe domains in Fe1−xGax thin films / Fin, S.; Tomasello, R.; Bisero, D.; Marangolo, M.; Sacchi, M.; Popescu, H.; Eddrief, M.; Hepburn, C.; Finocchio, G.; Carpentieri, M.; Rettori, A.; Pini, M.G.; Tacchi, S.. - In: PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS. - ISSN 1098-0121. - STAMPA. - 92:(2015), pp. 224411-1-224411-9.

In-plane rotation of magnetic stripe domains in Fe1−xGax thin films

RETTORI, ANGELO;
2015

Abstract

The in-plane rotation of magnetic stripe domains in a 65-nm magnetostrictive Fe0.8Ga0.2 epitaxial film was investigated combining magnetic force microscopy, vibration sample magnetometry, and x-ray resonant magnetic scattering measurements.We analyzed the behavior of the stripe pattern under the application of a bias magnetic field along the in-plane direction perpendicular to the stripe axis, and made a comparison with the analogous behavior at remanence. The experimental results have been explained by means of micromagnetic simulations, supported by energy balance considerations. Fields smaller than ∼400 Oe do not induce any stripe rotation; rather, a deformation of the closure domains pattern was evidenced. Larger fields produce a sudden rotation of the stripe structure.
2015
92
224411-1
224411-9
Fin, S.; Tomasello, R.; Bisero, D.; Marangolo, M.; Sacchi, M.; Popescu, H.; Eddrief, M.; Hepburn, C.; Finocchio, G.; Carpentieri, M.; Rettori, A.; Pin...espandi
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/1022688
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