Symbolic techniques in parametric fault diagnosis of analog circuits

Grasso, Francesco; Luchetta, Antonio; Manetti, Stefano; Piccirilli, Maria Cristina

The role of symbolic techniques in the automation of parametric fault diagnosis of analog circuits is investigated. In particular the importance of symbolic approach in phase of testability analysis is shown and the symbolic method convenience in fault location phase is valued. To this end three different methodologies, based on Newton-Raphson type algorithms, neural networks and genetic algorithms are considered. An application example is also included.

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Titolo:	Symbolic techniques in parametric fault diagnosis of analog circuits
Autori di Ateneo:	GRASSO, FRANCESCO LUCHETTA, ANTONIO MANETTI, STEFANO PICCIRILLI, MARIA CRISTINA
Autori:	GRASSO, FRANCESCO; LUCHETTA, ANTONIO; MANETTI, STEFANO; PICCIRILLI, MARIA CRISTINA
Anno di registrazione:	2002
Titolo del libro:	Proceedings of 8th Biennial Baltic Electronics Conference, BEC 2002
Titolo del congresso:	8th Biennial Baltic Electronics Conference, BEC 2002
Luogo del congresso:	TALLINN, ESTONIA
Data del congresso:	6-9 ottobre 2002
Abstract:	The role of symbolic techniques in the automation of parametric fault diagnosis of analog circuits is investigated. In particular the importance of symbolic approach in phase of testability analysis is shown and the symbolic method convenience in fault location phase is valued. To this end three different methodologies, based on Newton-Raphson type algorithms, neural networks and genetic algorithms are considered. An application example is also included.
Handle:	http://hdl.handle.net/2158/10453
Appare nelle tipologie:	4a - Articolo in atti di congresso

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