The role of symbolic techniques in the automation of parametric fault diagnosis of analog circuits is investigated. In particular the importance of symbolic approach in phase of testability analysis is shown and the symbolic method convenience in fault location phase is valued. To this end three different methodologies, based on Newton-Raphson type algorithms, neural networks and genetic algorithms are considered. An application example is also included.
Titolo: | Symbolic techniques in parametric fault diagnosis of analog circuits |
Autori di Ateneo: | |
Autori: | GRASSO, FRANCESCO; LUCHETTA, ANTONIO; MANETTI, STEFANO; PICCIRILLI, MARIA CRISTINA |
Anno di registrazione: | 2002 |
Titolo del libro: | Proceedings of 8th Biennial Baltic Electronics Conference, BEC 2002 |
Titolo del congresso: | 8th Biennial Baltic Electronics Conference, BEC 2002 |
Luogo del congresso: | TALLINN, ESTONIA |
Data del congresso: | 6-9 ottobre 2002 |
Abstract: | The role of symbolic techniques in the automation of parametric fault diagnosis of analog circuits is investigated. In particular the importance of symbolic approach in phase of testability analysis is shown and the symbolic method convenience in fault location phase is valued. To this end three different methodologies, based on Newton-Raphson type algorithms, neural networks and genetic algorithms are considered. An application example is also included. |
Handle: | http://hdl.handle.net/2158/10453 |
Appare nelle tipologie: | 4a - Articolo in atti di congresso |
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