A program for the determination of testability and canonical ambiguity groups in analog linear circuits is presented. In the program an efficient approach, based on the Singular-Value Decomposition (SVD), is applied to the testability matrix of the circuit under test. Differently from previous procedures for testability and ambiguity group determination affected by round-off errors, the proposed approach has the advantage of being more robust to numerical errors thanks to the use of SVD, a powerful technique used in many matrix computation and analyses. The developed program has been realized by exploiting symbolic analysis techniques. An application example is also included.