A program for the determination of testability and canonical ambiguity groups in analog linear circuits is presented. In the program an efficient approach, based on the Singular-Value Decomposition (SVD), is applied to the testability matrix of the circuit under test. Differently from previous procedures for testability and ambiguity group determination affected by round-off errors, the proposed approach has the advantage of being more robust to numerical errors thanks to the use of SVD, a powerful technique used in many matrix computation and analyses. The developed program has been realized by exploiting symbolic analysis techniques. An application example is also included.
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http://hdl.handle.net/2158/10455
Titolo: | A program for ambiguity group determination in analog circuits using singular-value decomposition |
Autori di Ateneo: | |
Autori: | GRASSO, FRANCESCO; MANETTI, STEFANO; PICCIRILLI, MARIA CRISTINA |
Anno di registrazione: | 2003 |
Titolo del libro: | Proceedings of the European Conference on Circuit Theory and Design 2003 |
Titolo del congresso: | XVI European Conference on Circuit Theory and Design, ECCTD'03 |
Luogo del congresso: | CRACOW, POLAND |
Data del congresso: | 1-4 settembre 2003 |
Abstract: | A program for the determination of testability and canonical ambiguity groups in analog linear circuits is presented. In the program an efficient approach, based on the Singular-Value Decomposition (SVD), is applied to the testability matrix of the circuit under test. Differently from previous procedures for testability and ambiguity group determination affected by round-off errors, the proposed approach has the advantage of being more robust to numerical errors thanks to the use of SVD, a powerful technique used in many matrix computation and analyses. The developed program has been realized by exploiting symbolic analysis techniques. An application example is also included. |
Handle: | http://hdl.handle.net/2158/10455 |
Appare nelle tipologie: | 4a - Articolo in atti di congresso |
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