Modelling and understanding the electrical ageing is a complex phenomenon, in particular for composite material as electrically conductive adhesive consisting of a nonconductive polymer binder and conductive filler particles. This research involves a large amount of parameters related to both operating conditions and material structure, which act together. Accelerated testing used in order to describe the ageing process and to determine the lifetime of these material are difficult to implement with the aim to consume rapidly lifetime without inducing incorrect failure mechanisms. Further difficulties are the implementation of the right chemico-physical ageing model for lifetime prediction under accelerated testing and new statistical approach for reliability data analysis and treatment.

Experimental data and statistical models for optimization of ageing model of lead-free electronic interconnection material / Berni, Rossella; Scarano, Valeria L.; Catelani, Marcantonio. - STAMPA. - 1:(2012), pp. 540-544. (Intervento presentato al convegno 20th IMEKO World Congress 2012 tenutosi a Busan, kor nel 2012).

Experimental data and statistical models for optimization of ageing model of lead-free electronic interconnection material

BERNI, ROSSELLA;CATELANI, MARCANTONIO
2012

Abstract

Modelling and understanding the electrical ageing is a complex phenomenon, in particular for composite material as electrically conductive adhesive consisting of a nonconductive polymer binder and conductive filler particles. This research involves a large amount of parameters related to both operating conditions and material structure, which act together. Accelerated testing used in order to describe the ageing process and to determine the lifetime of these material are difficult to implement with the aim to consume rapidly lifetime without inducing incorrect failure mechanisms. Further difficulties are the implementation of the right chemico-physical ageing model for lifetime prediction under accelerated testing and new statistical approach for reliability data analysis and treatment.
2012
20th IMEKO World Congress 2012
20th IMEKO World Congress 2012
Busan, kor
2012
Berni, Rossella; Scarano, Valeria L.; Catelani, Marcantonio
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/1050102
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