In this paper a fault diagnosis technique for electronic analog circuits is described. Diagnosis is obtained by comparing input-output measurements with examples contained in a fault dictionary, by means of a neural classifier. A harmonic analysis is used, i.e. the test stimuli are sinusoidal waves. A novel method for optimizing the fault dictionary construction is proposed. In particular, the stimuli selection is optimized by means of a sensitivity analysis of the Circuit Under Test-CUT-relying on a probabilistic approach based on randomized algorithms. This technique allows removing all the hypothesis assumed by the related literature. In fact it allows to remove the small perturbation assumption and presents a poly-time solution independently from the dimension of the perturbation.

Soft fault diagnosis in analog electronic circuits: Sensitivity analysis by randomized algorithms / Alippi, C; Catelani, M.; Fort, A.. - STAMPA. - 3:(2001), pp. 1592-1595. (Intervento presentato al convegno 18th IEEE Instrumentation and Measurement Technology Conference tenutosi a Budapest, hun nel 2001).

Soft fault diagnosis in analog electronic circuits: Sensitivity analysis by randomized algorithms

CATELANI, MARCANTONIO;
2001

Abstract

In this paper a fault diagnosis technique for electronic analog circuits is described. Diagnosis is obtained by comparing input-output measurements with examples contained in a fault dictionary, by means of a neural classifier. A harmonic analysis is used, i.e. the test stimuli are sinusoidal waves. A novel method for optimizing the fault dictionary construction is proposed. In particular, the stimuli selection is optimized by means of a sensitivity analysis of the Circuit Under Test-CUT-relying on a probabilistic approach based on randomized algorithms. This technique allows removing all the hypothesis assumed by the related literature. In fact it allows to remove the small perturbation assumption and presents a poly-time solution independently from the dimension of the perturbation.
2001
Conference Record - IEEE Instrumentation and Measurement Technology Conference
18th IEEE Instrumentation and Measurement Technology Conference
Budapest, hun
2001
Alippi, C; Catelani, M.; Fort, A.
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/1050218
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