The high pressure structural and reactive beahvior of graphene oxide (GO) in the presence of Ar, N2, and NH3 was studied in diamond anvil cells (DAC) by X-ray diffraction (XRD) and vibrational spectroscopy (FTIR and Raman), with the purpose of investigating the use of pressure for N-doping and functionalization of GO in high-density conditions. The pressure evolution of the interlayer d-spacing of GO during room temperature compression and decompression indicates the pressure-induced insertion of the selected systems between the GO layers and the stability of the GO layered structure at high pressure. Thermal and photoinduced reactivity was studied in GO with N2 and in GO with NH3 in different pressure conditions.

High-Pressure Chemistry of Graphene Oxide in the Presence of Ar, N2, and NH3 / Ceppatelli, Matteo; Scelta, Demetrio; Tuci, Giulia; Giambastiani, Giuliano; Hanfland, Michael; Bini, Roberto. - In: JOURNAL OF PHYSICAL CHEMISTRY. C. - ISSN 1932-7447. - STAMPA. - 120:(2016), pp. 5174-5187. [10.1021/acs.jpcc.5b12274]

High-Pressure Chemistry of Graphene Oxide in the Presence of Ar, N2, and NH3

CEPPATELLI, MATTEO;SCELTA, DEMETRIO;TUCI, GIULIA;GIAMBASTIANI, GIULIANO;BINI, ROBERTO
2016

Abstract

The high pressure structural and reactive beahvior of graphene oxide (GO) in the presence of Ar, N2, and NH3 was studied in diamond anvil cells (DAC) by X-ray diffraction (XRD) and vibrational spectroscopy (FTIR and Raman), with the purpose of investigating the use of pressure for N-doping and functionalization of GO in high-density conditions. The pressure evolution of the interlayer d-spacing of GO during room temperature compression and decompression indicates the pressure-induced insertion of the selected systems between the GO layers and the stability of the GO layered structure at high pressure. Thermal and photoinduced reactivity was studied in GO with N2 and in GO with NH3 in different pressure conditions.
2016
120
5174
5187
Ceppatelli, Matteo; Scelta, Demetrio; Tuci, Giulia; Giambastiani, Giuliano; Hanfland, Michael; Bini, Roberto
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/1079528
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