Fault detection in Class-E2 resonant converters

DC-DC converter reliability is of primary interest due to their key role in electronic systems. This paper proposes a diagnostic algorithm, which can be easily implemented in digital programmable device for MOSFET fault detection and identification. An improvement over the existing technique is presented, and its rapid fault detection capability is demonstrated. The two basic faults, namely the short circuit (SCF) and the open circuit fault (OCF) are identified by analyzing the current through the choke inductance. Upon identification of the fault signature, techniques to mitigate the after-effects are discussed. To validate the algorithm, a simulation on a Class-E2 resonant converter is presented.