© 2015 IEEE. In order to fulfil the need of cheap and high-resolution radiation beam monitors we exploited the possibility of using commercial CMOS image sensors as X-rays and low-intensity particle beam monitors. CMOS sensors nowadays offer a wide range of resolutions with excellent spectral and chromatic responses as well as generally low cost. We have now selected a novel CMOS sensor that is provided in a naked packaging. This opens the way to improved performance in X-ray sensing even at lower energies, where the small depleted volume typical of a CMOS sensor provides the best efficiency. The paper will focus on the description of the architecture of the sensor system and on the results of the experimental qualification of the sensor cell and of the imaging system as X-ray imager and beam monitor.
Application of naked commercial CMOS sensors to X-ray fluorescence and X-ray beam monitoring / Castoldi A.; Guazzoni C.; Maffessanti S.; Montemurro G.V.; Carraresi L.. - STAMPA. - (2016), pp. 1-3. (Intervento presentato al convegno 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015 tenutosi a usa nel 2015) [10.1109/NSSMIC.2015.7581892].
Application of naked commercial CMOS sensors to X-ray fluorescence and X-ray beam monitoring
Carraresi L.Membro del Collaboration Group
2016
Abstract
© 2015 IEEE. In order to fulfil the need of cheap and high-resolution radiation beam monitors we exploited the possibility of using commercial CMOS image sensors as X-rays and low-intensity particle beam monitors. CMOS sensors nowadays offer a wide range of resolutions with excellent spectral and chromatic responses as well as generally low cost. We have now selected a novel CMOS sensor that is provided in a naked packaging. This opens the way to improved performance in X-ray sensing even at lower energies, where the small depleted volume typical of a CMOS sensor provides the best efficiency. The paper will focus on the description of the architecture of the sensor system and on the results of the experimental qualification of the sensor cell and of the imaging system as X-ray imager and beam monitor.
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