A methodology to characterize the complex dielectric permittivity of low-loss materials at millimeter and submillimeter wavelengths, based on whispering gallery mode dielectric resonators, is presented, together with some illustrative results.
Dielectric characterization by means of whispering gallery mode Resonators / Fittipaldi M.; Strambini E.; Martinelli M.; Annino G.. - ELETTRONICO. - (2010), pp. 1-2. (Intervento presentato al convegno 35th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2010 tenutosi a Rome, ita nel 2010) [10.1109/ICIMW.2010.5612784].
Dielectric characterization by means of whispering gallery mode Resonators
Fittipaldi M.;
2010
Abstract
A methodology to characterize the complex dielectric permittivity of low-loss materials at millimeter and submillimeter wavelengths, based on whispering gallery mode dielectric resonators, is presented, together with some illustrative results.
File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in FLORE sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
