This study investigates the crystal structure of thin films of chalcogenides, particularly a junction with a p-type (Cu2S) and an n-type (CdS) layer deposited one on top of the other on a Ag(111) substrate, starting from an aqueous solution and by means of electrochemical atomic layer deposition (E-ALD) (the system is denoted by (Cu2S)60/(CdS)60/Ag(111)).
Surface X-ray Diffraction Study of a Bi-Layer Junction Based on Cu and Cd Sulfides for Photovoltaic Applications / Tommaso Baroni; Francesco Di Benedetto; Andrea Giaccherini; Enrico Berretti; Francesca Russo; Annalisa Guerri; Massimo Innocenti; Francesco Carlà; Roberto Felici. - In: MATERIALS PROCEEDINGS. - ISSN 2673-4605. - ELETTRONICO. - 2:(2020), pp. 0-0. [10.3390/ciwc2020-06836]
Surface X-ray Diffraction Study of a Bi-Layer Junction Based on Cu and Cd Sulfides for Photovoltaic Applications
Tommaso Baroni;Francesco Di Benedetto;Enrico Berretti;Annalisa Guerri;Massimo Innocenti;Francesco Carlà;
2020
Abstract
This study investigates the crystal structure of thin films of chalcogenides, particularly a junction with a p-type (Cu2S) and an n-type (CdS) layer deposited one on top of the other on a Ag(111) substrate, starting from an aqueous solution and by means of electrochemical atomic layer deposition (E-ALD) (the system is denoted by (Cu2S)60/(CdS)60/Ag(111)).
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