Precision farming is based on monitoring environmental conditions and soil parameter to improve productivity, to optimize soil conservation, to save water and to limit plant diseases. Wireless sensor networks are an optimal solution to implement this monitoring process, covering large area and ensuring fault tolerance. Currently, there are no international standards that deal with environmental testing of Wireless Sensor Networks; therefore a customized test plan was developed basing on a step stress test from 20 °C to 80 °C, with 5 °C steps. The objective of the analysis was to investigate the effects of raised temperature on the performances of a self-designed sensor node. A customized measurement set-up is presented in this paper to test electrical and electronic performances of the node under thermal stress.
Electrical characterization of a monitoring system for precision farming under temperature stress / Ciani L.; Catelani M.; Bartolini A.; Guidi G.; Patrizi G.. - ELETTRONICO. - (2020), pp. 270-275. (Intervento presentato al convegno 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, IWADC 2020 tenutosi a Palermo, Virtual; Italy nel 14 September 2020 through 16 September 2020).
Electrical characterization of a monitoring system for precision farming under temperature stress
Ciani L.;Catelani M.;Bartolini A.;Guidi G.;Patrizi G.
2020
Abstract
Precision farming is based on monitoring environmental conditions and soil parameter to improve productivity, to optimize soil conservation, to save water and to limit plant diseases. Wireless sensor networks are an optimal solution to implement this monitoring process, covering large area and ensuring fault tolerance. Currently, there are no international standards that deal with environmental testing of Wireless Sensor Networks; therefore a customized test plan was developed basing on a step stress test from 20 °C to 80 °C, with 5 °C steps. The objective of the analysis was to investigate the effects of raised temperature on the performances of a self-designed sensor node. A customized measurement set-up is presented in this paper to test electrical and electronic performances of the node under thermal stress.
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