Introductory notes for the Acta IMEKO special issue on the 17th IMEKO technical committee 10 conference ‘Global trends in testing, diagnostics & inspection for 2030’ (2nd conference jointly organised by IMEKO and EUROLABl)

The area of technical diagnostics is one of the most significant research fields, one that involves a broad range of measurements, with various sensors, actuators and advanced computing techniques exploited. As we are becoming increasingly surrounded by the growing amount of autonomous machinery, it is crucial to ensure regular and accurate monitoring is carried out. The Technical Committee 10 (Measurement for Diagnostics, Optimization & Control) is responsible for fostering the research on such topics, which is expressed in terms of a wide range of activities, including the organisation of annual conferences and workshops aimed solely at the problems pertaining to fault detection, identification and location. The solutions for these problems include the array of algorithms, measurement tools and procedures applicable for individual devices and industrial processes. The 17th IMEKO TC10 conference held in 2020 is a perfect example of this approach.