All-dielectric, sub-micrometric particles obtained through solid state dewetting of thin SiGe-films have been shown to support Mie resonances together with a high-quality monocrystalline composition and atomically smooth facets. Recently, a precise study on the impact given by the effective complex morphology of a SiGe dewetted nanoparticle to the Mie scattering properties has been provided and carried on through a novel experimental technique called Dark-field Scanning Optical Microscopy. In this work, by means of the same experimental technique and numerical simulations of light scattering, we show how the presence of a pedestal enriched with silicon placed under the SiGe-nanoparticle results in a sharp peak at high energy in the total scattering cross-section. Exploiting a tilted illumination to redirect scattered light, we are able to discriminate the spatial localization of the pedestal-induced resonance. Our results contribute to extending the practical implementations of dewetted Mie resonators in the field of light scattering directionality, sensing applications and show further engineering options beyond the simple isolated-island case.

Light scattering features induced by residual layers in dielectric dewetted nanoparticles / Granchi, Nicoletta; Fagiani, Luca; Barri, Chiara; Fedorov, Alexey; Abbarchi, Marco; Vincenti, Maria Antonietta; Intonti, Francesca; Bollani, Monica. - In: OPTICAL MATERIALS EXPRESS. - ISSN 2159-3930. - ELETTRONICO. - 13:(2023), pp. 3394-3404. [10.1364/ome.498142]

Light scattering features induced by residual layers in dielectric dewetted nanoparticles

Granchi, Nicoletta
;
Intonti, Francesca;
2023

Abstract

All-dielectric, sub-micrometric particles obtained through solid state dewetting of thin SiGe-films have been shown to support Mie resonances together with a high-quality monocrystalline composition and atomically smooth facets. Recently, a precise study on the impact given by the effective complex morphology of a SiGe dewetted nanoparticle to the Mie scattering properties has been provided and carried on through a novel experimental technique called Dark-field Scanning Optical Microscopy. In this work, by means of the same experimental technique and numerical simulations of light scattering, we show how the presence of a pedestal enriched with silicon placed under the SiGe-nanoparticle results in a sharp peak at high energy in the total scattering cross-section. Exploiting a tilted illumination to redirect scattered light, we are able to discriminate the spatial localization of the pedestal-induced resonance. Our results contribute to extending the practical implementations of dewetted Mie resonators in the field of light scattering directionality, sensing applications and show further engineering options beyond the simple isolated-island case.
2023
13
3394
3404
Goal 7: Affordable and clean energy
Granchi, Nicoletta; Fagiani, Luca; Barri, Chiara; Fedorov, Alexey; Abbarchi, Marco; Vincenti, Maria Antonietta; Intonti, Francesca; Bollani, Monica...espandi
File in questo prodotto:
File Dimensione Formato  
75_optical_materials_express_2023.pdf

accesso aperto

Tipologia: Pdf editoriale (Version of record)
Licenza: Open Access
Dimensione 3.91 MB
Formato Adobe PDF
3.91 MB Adobe PDF

I documenti in FLORE sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/1354937
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 2
  • ???jsp.display-item.citation.isi??? 2
social impact