We present a measurement of the charged kaon semileptonic form factors based on 4.3 million K± ? p0e±?e and 2.9 million K± ? p0µ±?µ decays collected by the NA48/2 experiment. The single results for the semi-electronic and semi-muonic channel have better and similar precision, respectively, than previous measurements. The combination of both channels yields the most precise measurement of the form factors of semileptonic kaon decays.

Precision measurement of the form factors of semileptonic charged kaon decays from NA48/2 / Shkarovskiy S.; Anzivino G.; Arcidiacono R.; Baldini W.; Balev S.; Batley J.R.; Behler M.; Bifani S.; Biino C.; Bizzeti A.; Bloch-Devaux B.; Bocquet G.; Cabibbo N.; Calvetti M.; Cartiglia N.; Ceccucci A.; Celeghini E.; Cenci P.; Cerri C.; Cheshkov C.; Cheze J.B.; Clemencic M.; Collazuol G.; Costantini F.; Cotta Ramusino A.; Coward D.; Cundy D.; Dabrowski A.; Dalpiaz P.; Damiani C.; de Beer M.; Derre J.; Dibon H.; DiLella L.; Doble N.; Eppard K.; Falaleev V.; Fantechi R.; Fidecaro M.; Fiorini L.; Fiorini M.; Fonseca Martin T.; Frabetti P.L.; Gatignon L.; Gersabeck E.; Gianoli A.; Giudici S.; Gonidec A.; Goudzovski E.; Goy Lopez S.; Hita-Hochgesand M.; Holder M.; Hristov P.; Iacopini E.; Imbergamo E.; Jeitler M.; Kalmus G.; Kekelidze V.; Kleinknecht K.; Kozhuharov V.; Kubischta W.; Lamanna G.; Lazzeroni C.; Lenti M.; Litov L.; Madigozhin D.; Maier A.; Mannelli I.; Marchetto F.; Marchevski R.; Marel G.; Markytan M.; Marouelli P.; Martini M.; Masetti L.; Mazzucato E.; Michetti A.; Mikulec I.; Misheva M.; Molokanova N.; Monnier E.; Moosbrugger U.; Morales Morales C.; Munday D.J.; Nappi A.; Neuhofer G.; Norton A.; Patel M.; Pepe M.; Peters A.; Petrucci F.; Petrucci M.C.; Peyaud B.; Piccini M.; Pierazzini G.; Polenkevich I.; Potrebenikov Yu.; Raggi M.; Renk B.; Rubin P.; Ruggiero G.; Savrie M.; Scarpa M.; Shieh M.; Shkarovskiy S.; Slater M.W.; Sozzi M.; Stoynev S.; Swallow E.; Szleper M.; Valdata-Nappi M.; Vallage B.; Velasco M.; Veltri M.; Venditti S.; Wache M.; Wahl H.; Walker A.; Wanke R.; Widhalm L.; Winhart A.; Winston R.; Wood M.D.; Wotton S.A.; Zinchenko A.; Ziolkowski M.. - ELETTRONICO. - (2018), pp. 315-318. (Intervento presentato al convegno 53rd Rencontres de Moriond on QCD and High Energy Interactions 2018 tenutosi a Aosta Valley, ita nel 2018).

Precision measurement of the form factors of semileptonic charged kaon decays from NA48/2

Bizzeti A.
;
Calvetti M.
;
Celeghini E.
;
Cerri C.;Collazuol G.;Fantechi R.;Iacopini E.
;
Lenti M.
;
Mannelli I.;Marchevski R.
;
Peters A.;Raggi M.;Ruggiero G.
;
2018

Abstract

We present a measurement of the charged kaon semileptonic form factors based on 4.3 million K± ? p0e±?e and 2.9 million K± ? p0µ±?µ decays collected by the NA48/2 experiment. The single results for the semi-electronic and semi-muonic channel have better and similar precision, respectively, than previous measurements. The combination of both channels yields the most precise measurement of the form factors of semileptonic kaon decays.
2018
Proceedings of the 53rd Rencontres de Moriond - 2018 QCD and High Energy Interactions
53rd Rencontres de Moriond on QCD and High Energy Interactions 2018
Aosta Valley, ita
2018
Shkarovskiy S.; Anzivino G.; Arcidiacono R.; Baldini W.; Balev S.; Batley J.R.; Behler M.; Bifani S.; Biino C.; Bizzeti A.; Bloch-Devaux B.; Bocquet G...espandi
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/1405915
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