New upper limits for β -delayed fission probabilities of Fr 230,232 and Ac 230,232,234

Bara, S.; Algora, A.; Andel, B.; Andreyev, A. N.; Antalic, S.; Bark, R. A.; Borge, M. J. G.; Camaiani, A.; Cocolios, T. E.; Cubiss, J. G.; De Witte, H.; Fajardo-Zambrano, C. M.; Favier, Z.; Fraile, L. M.; Fynbo, H. O. U.; Goriely, S.; Grzywacz, R.; Heines, M.; Ivandikov, F.; Johnson, J. D.; Jones, P. M.; Judson, D. S.; Klimo, J.; Korgul, A.; Labiche, M.; Lica, R.; Madurga, M.; Marginean, N.; Mihai, C.; Mist, J.; Nacher, E.; Neacsu, C.; Orce, J. N.; Page, C. A. A.; Page, R. D.; Pakarinen, J.; Papadakis, P.; Perea, A.; Piersa-Silkowska, M.; Podolyak, Z.; Raabe, R.; Ryssens, W.; Sanchez-Fernandez, A.; Sitarcik, A.; Tengblad, O.; Udias, J. M.; Van Den Bergh, V.; Van Duppen, P.; Warr, N.; Youssef, A.; Yue, Z.

doi:10.1103/PhysRevC.111.065803

The process of β-delayed fission (βDF) of Fr230,232 and Ac230,232,234 was studied in an experiment performed at the ISOLDE facility at CERN. As no fission fragments were observed for any of the nuclei investigated, upper limits for their βDF probability (PβDF) were determined. The experimental results were compared with theoretical calculations that were first benchmarked on Tl178,180PβDF experimental values. The PβDF values were calculated using the code TALYS to which β-strength functions obtained from the D1M Gogny parametrization and from the Skyrme functional SKO' were given as input together with fission paths obtained with BSkG3 and BSk14 models. Sensitivity studies of different β-strength functions, and fission paths scaling on the PβDF values were conducted, suggesting a stronger dependence of the PβDF on the fission paths rather than on the β-strength function used.

New upper limits for β -delayed fission probabilities of Fr 230,232 and Ac 230,232,234 / Bara S.; Algora A.; Andel B.; Andreyev A.N.; Antalic S.; Bark R.A.; Borge M.J.G.; Camaiani A.; Cocolios T.E.; Cubiss J.G.; De Witte H.; Fajardo-Zambrano C.M.; Favier Z.; Fraile L.M.; Fynbo H.O.U.; Goriely S.; Grzywacz R.; Heines M.; Ivandikov F.; Johnson J.D.; Jones P.M.; Judson D.S.; Klimo J.; Korgul A.; Labiche M.; Lica R.; Madurga M.; Marginean N.; Mihai C.; Mist J.; Nacher E.; Neacsu C.; Orce J.N.; Page C.A.A.; Page R.D.; Pakarinen J.; Papadakis P.; Perea A.; Piersa-Silkowska M.; Podolyak Z.; Raabe R.; Ryssens W.; Sanchez-Fernandez A.; Sitarcik A.; Tengblad O.; Udias J.M.; Van Den Bergh V.; Van Duppen P.; Warr N.; Youssef A.; Yue Z.. - In: PHYSICAL REVIEW. C. - ISSN 2469-9993. - ELETTRONICO. - 111:(2025), pp. 065803.0-065803.0. [10.1103/PhysRevC.111.065803]