Dual Pattern Elements for Scan Loss Reduction in Wide-Angle Scanning Phased Arrays

Active electronically scanned arrays and reconfigurable intelligent surfaces are becoming ubiquitous in radar and telecommunication applications. A major issue in these devices is to achieve wide scan angles from broadside direction. Among the issues at wide scan angles, there is the scan loss inherent in the radiating element constituting the array. In this contribution, an element capable of selectively synthesizing two patterns is proposed to effectively reduce scan loss over a very wide scanning angle. The proposed element does not require complex control electronics but a switch to select one of the two feed points in the element.