A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in the canonical ambiguity group concept. New considerations relevant to the existence of unique solution in the k-fault diagnosis problem of analog linear circuits are presented, and examples of application of the developed procedure are considered by exploiting a software package based on symbolic analysis techniques.
Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits / FEDI G.; S. MANETTI; PICCIRILLI M.C.; STARZYK J.. - In: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I. FUNDAMENTAL THEORY AND APPLICATIONS. - ISSN 1057-7122. - STAMPA. - 46:(1999), pp. 779-787. [10.1109/81.774222]
Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits
MANETTI, STEFANO;PICCIRILLI, MARIA CRISTINA;
1999
Abstract
A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in the canonical ambiguity group concept. New considerations relevant to the existence of unique solution in the k-fault diagnosis problem of analog linear circuits are presented, and examples of application of the developed procedure are considered by exploiting a software package based on symbolic analysis techniques.
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