The paper addresses the problem of evaluating magnitude bounds on higher harmonics of the periodic tip oscillation in an Atomic Force Microscope (AFM). The suggested approach considers a class of nonlinearities well suited to the tip-sample interaction in AFMs, and reduces the bounding problem to an optimization problem. For a relaxation of the problem a solution in a closed form is provided and reduces the conservativeness of estimates existing in literature.

Harmonic Bounds in Atomic Force Microscopy / D. MATERASSI; M. SALAPAKA; M. BASSO. - ELETTRONICO. - (2005), pp. 8221-8226. (Intervento presentato al convegno IEEE Conference on Decision and Control - European Control Conference tenutosi a Siviglia (ESP) nel 2005) [10.1109/CDC.2005.1583493].

Harmonic Bounds in Atomic Force Microscopy

MATERASSI, DONATELLO;BASSO, MICHELE
2005

Abstract

The paper addresses the problem of evaluating magnitude bounds on higher harmonics of the periodic tip oscillation in an Atomic Force Microscope (AFM). The suggested approach considers a class of nonlinearities well suited to the tip-sample interaction in AFMs, and reduces the bounding problem to an optimization problem. For a relaxation of the problem a solution in a closed form is provided and reduces the conservativeness of estimates existing in literature.
2005
44th IEEE Conference on Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05.
IEEE Conference on Decision and Control - European Control Conference
Siviglia (ESP)
2005
D. MATERASSI; M. SALAPAKA; M. BASSO
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/259897
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