This paper reports the result of a study aimed at determining the composition of Ti/TiN coatings deposited by reactive plasma spray (RPS). The coatings were obtained by spraying titanium powder in a low pressure N2/Ar atmosphere. The resulting film has a variable nitrogen content in the form of titanium nitrides, depending on experimental parameters such as the gas partial pressure, total pressure, distance sample-source, etc. The determination of the composition of the film can be obtained in principle by various methods. Here we have performed a comparative compositional study using X-ray photoelectron spectroscopy and X-ray diffraction. We found that the two techniques provide very similar results and hence either one can be used for the compositional characterization of these coatings.
Reactive Plasma Spray for the Deposition of Ti/TiN Coatings: A Comparative Compositional Study by X-Ray Diffraction (XRD) and X-Ray Photoelectron Spectroscopy (XPS) / T. Bacci; U. Bardi; F. Borgioli; E. Galvanetto; F. Galliano; A. Lavacchi; A. Scrivani. - STAMPA. - (2000), pp. 289-291. (Intervento presentato al convegno ITSC tenutosi a Montreal nel 8-11 maggio 2000).
Reactive Plasma Spray for the Deposition of Ti/TiN Coatings: A Comparative Compositional Study by X-Ray Diffraction (XRD) and X-Ray Photoelectron Spectroscopy (XPS)
BACCI, TIBERIO;BARDI, UGO;BORGIOLI, FRANCESCA;GALVANETTO, EMANUELE;
2000
Abstract
This paper reports the result of a study aimed at determining the composition of Ti/TiN coatings deposited by reactive plasma spray (RPS). The coatings were obtained by spraying titanium powder in a low pressure N2/Ar atmosphere. The resulting film has a variable nitrogen content in the form of titanium nitrides, depending on experimental parameters such as the gas partial pressure, total pressure, distance sample-source, etc. The determination of the composition of the film can be obtained in principle by various methods. Here we have performed a comparative compositional study using X-ray photoelectron spectroscopy and X-ray diffraction. We found that the two techniques provide very similar results and hence either one can be used for the compositional characterization of these coatings.I documenti in FLORE sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.