Tapping mode atomic force microscopy provides good resolution in imaging applications, but it still requires a time-consuming initial configuration and features quite low scanning velocity. In this paper we present a new dynamic mode in which the cantilever gets excited by a feedback loop containing a saturation function. The proposed scheme is then analysed in the frequency domain and simulated against the standard set-up, showing good performance and elimination of some of the known drawbacks. Preliminary results in experiments confirm the effectiveness of this operating mode.

Modelling and analysis of autonomous micro-cantilever oscillations / M. Basso; P. Paoletti; B. Tiribilli; M. Vassalli. - In: NANOTECHNOLOGY. - ISSN 0957-4484. - STAMPA. - 19:(2008), pp. 475501-475508. [10.1088/0957-4484/19/47/475501]

Modelling and analysis of autonomous micro-cantilever oscillations

BASSO, MICHELE;PAOLETTI, PAOLO;VASSALLI, MASSIMO
2008

Abstract

Tapping mode atomic force microscopy provides good resolution in imaging applications, but it still requires a time-consuming initial configuration and features quite low scanning velocity. In this paper we present a new dynamic mode in which the cantilever gets excited by a feedback loop containing a saturation function. The proposed scheme is then analysed in the frequency domain and simulated against the standard set-up, showing good performance and elimination of some of the known drawbacks. Preliminary results in experiments confirm the effectiveness of this operating mode.
2008
19
475501
475508
M. Basso; P. Paoletti; B. Tiribilli; M. Vassalli
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/351179
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