Introduction to the T and Chi-Square distribution for a more accurate evaluation of the measure of the Word Error Rate in Analog-To-Digital Converters

The word error rate (WER) in an Analog to Digital Converter (ADC) is the probability of receiving an erroneous code for an input, after correction is made for gain, offset, and nonlinearity errors, and a specified allowance is made for noise. Typical causes of word errors are metastability and timing jitter of comparators within the ADC [1]. New statistical techniques which can better integrate what is sustained in the IEEE standard and in [2] have been proposed. In particular, Student and chi-square distributions have been introduced for a more accurate measurement of the word error rate in the case of n successive observations.