Silicon Carbide for High Signal to Noise Ratio MIPs Detection From Room Temperature to 80 °C

ABSTRACT The relatively low value of the number of electronhole (e-h) pairs per micron for Minimum Ionizing Particles (MIPs) in SiC against the value for Si, imposes severe constrains on the crystallographic quality, the thickness and the doping concentration of the SiC epitaxial layer used as detection medium. In this work, a 85 um thick 4H-SiC epitaxial layer with a low doping concentration, Neff<1 x 10^14/cm^3 , was used in order to have a high number (~4700) of e-h pairs generated by a MIP in the active region. We present experimental data on the charge spectrum for MIPs from a 90-Sr beta source, collected in a temperature range from room temperature up to 81 C.