Four novel Cd(C5F6HO2)(2).polyether adducts were prepared through simple procedures with stoichiometric quantities of cadmium oxide, hexafluoroacetylacetone C5F6H2O2, and different polyethers. The products were characterized by elemental analysis, X-ray single-crystal analysis, mass spectra, NMR spectra, thermal measurements, and infrared transmittance spectroscopy. X-ray single-crystal data of the Cd(C5F6HO2)(2).polyether adducts showed that all the oxygen atoms of the polyether molecules coordinate the cadmium cation. Very mild heating (44-74 degreesC) resulted in thermal stable, liquid compounds which, in turn, can be easily evaporated. Gas-phase deposition experiments, in a low-pressure horizontal hot-wall reactor, on SiO2 substrates, resulted in CdO films. XRD measurements provided evidence that they consist of cubic, (100)-oriented, crystals. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%.

Synthesis and Characterization of Liquid MOCVD Precursors for thin Films of Cadmium Oxide / A. Gulino; P. Dapporto; P. Rossi; I. Fragala'. - In: CHEMISTRY OF MATERIALS. - ISSN 0897-4756. - STAMPA. - 14:(2002), pp. 4955-4962. [10.1021/cm021183m]

Synthesis and Characterization of Liquid MOCVD Precursors for thin Films of Cadmium Oxide

ROSSI, PATRIZIA;
2002

Abstract

Four novel Cd(C5F6HO2)(2).polyether adducts were prepared through simple procedures with stoichiometric quantities of cadmium oxide, hexafluoroacetylacetone C5F6H2O2, and different polyethers. The products were characterized by elemental analysis, X-ray single-crystal analysis, mass spectra, NMR spectra, thermal measurements, and infrared transmittance spectroscopy. X-ray single-crystal data of the Cd(C5F6HO2)(2).polyether adducts showed that all the oxygen atoms of the polyether molecules coordinate the cadmium cation. Very mild heating (44-74 degreesC) resulted in thermal stable, liquid compounds which, in turn, can be easily evaporated. Gas-phase deposition experiments, in a low-pressure horizontal hot-wall reactor, on SiO2 substrates, resulted in CdO films. XRD measurements provided evidence that they consist of cubic, (100)-oriented, crystals. UV-vis spectra showed that the transmittance of as-deposited films in the visible region is about 90%.
2002
14
4955
4962
A. Gulino; P. Dapporto; P. Rossi; I. Fragala'
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/599209
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