Pseudorapidity distributions of charged particles produced in p¯p interactions as s=630 and 1800 GeV

Abe, F.; Amidei, D.; Apollinari, G.; Ascoli, G.; Atac, M.; Auchincloss, P.; Baden, A.; Barbaro Galtieri, A.; Barnes, V.; Bedeschi, F.; Belforte, S.; Bellettini, G.; Bellinger, J.; Bensinger, J.; Beretvas, A.; Berge, P.; Bertolucci, S.; Bhadra, S.; Binkley, M.; Blair, R.; Blocker, C.; Bofill, J.; Booth, A.; Brandenburg, G.; Brown, D.; Byon, A.; Byrum, K.; Campbell, M.; Carey, R.; Carithers, W.; Carlsmith, D.; Carroll, J.; Cashmore, R.; Cervelli, F.; Chadwick, K.; Chapin, T.; Chiarelli, G.; Chinowsky, W.; Cihangir, S.; Cline, D.; Connor, D.; Contreras, M.; Cooper, J.; Cordelli, M.; Curatolo, M.; Day, C.; Delfabbro, R.; Dell'Orso, M.; Demortier, L.; Devlin, T.; Dibitonto, D.; Diebold, R.; Dittus, F.; Divirgilio, A.; Elias, J.; Ely, R.; Errede, S.; Esposito, B.; Flaugher, B.; Focardi, Ettore; Foster, G.; Franklin, M.; Freeman, J.; Frisch, H.; Fukui, Y.; Garfinkel, A.; Giannetti, P.; Giokaris, N.; Giromini, P.; Gladney, L.; Gold, M.; Goulianos, K.; Grosso Pilcher, C.; Haber, C.; Hahn, S.; Handler, R.; Harris, R.; Hauser, J.; Hessing, T.; Hollebeek, R.; Hu, P.; Hubbard, B.; Hurst, P.; Huth, J.; Jensen, H.; Johnson, R.; Joshi, U.; Kadel, R.; Kamon, T.; Kanda, S.; Kardelis, D.; Karliner, I.; Kearns, E.; Kephart, R.; Kesten, P.; Keutelian, H.; Kim, S.; Kirsch, L.; Kondo, K.; Kruse, U.; Kuhlmann, S.; Laasanen, A.; Li, W.; Liss, T.; Lockyer, N.; Marchetto, F.; Markeloff, R.; Markosky, L.; Mcintyre, P.; Menzione, A.; Meyer, T.; Mikamo, S.; Miller, M.; Mimashi, T.; Miscetti, S.; Mishina, M.; Miyashita, S.; Mondal, N.; Mori, S.; Morita, Y.; Mukherjee, A.; Newman Holmes, C.; Nodulman, L.; Paoletti, R.; Para, A.; Patrick, J.; Phillips, T.; Piekarz, H.; Plunkett, R.; Pondrom, L.; Proudfoot, J.; Punzi, G.; Quarrie, D.; Ragan, K.; Redlinger, G.; Rhoades, J.; Rimondi, F.; Ristori, L.; Rohaly, T.; Roodman, A.; Sansoni, A.; Sard, R.; Scarpine, V.; Schlabach, P.; Schmidt, E.; Schoessow, P.; Schub, M.; Schwitters, R.; Scribano, A.; Segler, S.; Sekiguchi, M.; Sestini, P.; Shapiro, M.; Sheaff, M.; Shibata, M.; Shochet, M.; Siegrist, J.; Sinervo, P.; Skarha, J.; Smith, D.; Snider, F.; Denis, R. S. t.; Stefanini, A.; Takaiwa, Y.; Takikawa, K.; Tarem, S.; Theriot, D.; Tollestrup, A.; Tonelli, G.; Tsay, Y.; Ukegawa, F.; Underwood, D.; Vidal, R.; Wagner, R.; Wagner, R.; Walsh, J.; Watts, T.; Webb, R.; Westhusing, T.; White, S.; Wicklund, A.; Williams, H.; Yamanouchi, T.; Yamashita, A.; Yasuoka, K.; Yeh, G.; Yoh, J.; Zetti, F.

doi:10.1103/PhysRevD.41.2330

We present measurements of the pseudorapidity (η) distribution of charged particles (dNch/dη) produced within |η|≤3.5 in proton-antiproton collisions at √s of 630 and 1800 GeV. We measure dNch/dη at η=0 to be 3.18±0.06(stat)±0.10(syst) at 630 GeV, and 3.95±0.03 (stat)±0.13(syst) at 1800 GeV. Many systematic errors in the ratio of dNch/dη at the two energies cancel, and we measure 1.26±0.01±0.04 for the ratio of dNch/dη at 1800 GeV to that at 630 GeV within |η|≤3. Comparing to lower-energy data, we observe an increase faster than ln(s) in dNch/dη at η=0.

Pseudorapidity distributions of charged particles produced in p¯p interactions as s=630 and 1800 GeV / F. Abe;D. Amidei;G. Apollinari;G. Ascoli;M. Atac;P. Auchincloss;A. Baden;A. Barbaro-Galtieri;V. Barnes;F. Bedeschi;S. Belforte;G. Bellettini;J. Bellinger;J. Bensinger;A. Beretvas;P. Berge;S. Bertolucci;S. Bhadra;M. Binkley;R. Blair;C. Blocker;J. Bofill;A. Booth;G. Brandenburg;D. Brown;A. Byon;K. Byrum;M. Campbell;R. Carey;W. Carithers;D. Carlsmith;J. Carroll;R. Cashmore;F. Cervelli;K. Chadwick;T. Chapin;G. Chiarelli;W. Chinowsky;S. Cihangir;D. Cline;D. Connor;M. Contreras;J. Cooper;M. Cordelli;M. Curatolo;C. Day;R. DelFabbro;M. Dell'Orso;L. DeMortier;T. Devlin;D. DiBitonto;R. Diebold;F. Dittus;A. DiVirgilio;J. Elias;R. Ely;S. Errede;B. Esposito;B. Flaugher;E. Focardi;G. Foster;M. Franklin;J. Freeman;H. Frisch;Y. Fukui;A. Garfinkel;P. Giannetti;N. Giokaris;P. Giromini;L. Gladney;M. Gold;K. Goulianos;C. Grosso-Pilcher;C. Haber;S. Hahn;R. Handler;R. Harris;J. Hauser;T. Hessing;R. Hollebeek;P. Hu;B. Hubbard;P. Hurst;J. Huth;H. Jensen;R. Johnson;U. Joshi;R. Kadel;T. Kamon;S. Kanda;D. Kardelis;I. Karliner;E. Kearns;R. Kephart;P. Kesten;H. Keutelian;S. Kim;L. Kirsch;K. Kondo;U. Kruse;S. Kuhlmann;A. Laasanen;W. Li;T. Liss;N. Lockyer;F. Marchetto;R. Markeloff;L. Markosky;P. McIntyre;A. Menzione;T. Meyer;S. Mikamo;M. Miller;T. Mimashi;S. Miscetti;M. Mishina;S. Miyashita;N. Mondal;S. Mori;Y. Morita;A. Mukherjee;C. Newman-Holmes;L. Nodulman;R. Paoletti;A. Para;J. Patrick;T. Phillips;H. Piekarz;R. Plunkett;L. Pondrom;J. Proudfoot;G. Punzi;D. Quarrie;K. Ragan;G. Redlinger;J. Rhoades;F. Rimondi;L. Ristori;T. Rohaly;A. Roodman;A. Sansoni;R. Sard;V. Scarpine;P. Schlabach;E. Schmidt;P. Schoessow;M. Schub;R. Schwitters;A. Scribano;S. Segler;M. Sekiguchi;P. Sestini;M. Shapiro;M. Sheaff;M. Shibata;M. Shochet;J. Siegrist;P. Sinervo;J. Skarha;D. Smith;F. Snider;R. St. Denis;A. Stefanini;Y. Takaiwa;K. Takikawa;S. Tarem;D. Theriot;A. Tollestrup;G. Tonelli;Y. Tsay;F. Ukegawa;D. Underwood;R. Vidal;R. Wagner;R. Wagner;J. Walsh;T. Watts;R. Webb;T. Westhusing;S. White;A. Wicklund;H. Williams;T. Yamanouchi;A. Yamashita;K. Yasuoka;G. Yeh;J. Yoh;F. Zetti. - In: PHYSICAL REVIEW D. - ISSN 0556-2821. - ELETTRONICO. - 41:(1990), pp. 2330-2333. [10.1103/PhysRevD.41.2330]