An algorithm is presented for measuring linear analog circuit testability. This algorithm is based on the testability measurement theory developed by N. Sen and R. Saeks (1979). It makes use of the classical modified nodal analysis method and can be combined with standard computer-aided-design algorithms. This approach is also suitable when automatically determining the optimal choice of test points at design phase time. It may serve as an aid in functional partitioning of the same system to facilitate testing and/or reduce computational complexity. An application to a classical active filter is given.
MULTIFREQUENCY MEASUREMENT OF TESTABILITY WITH APPLICATION TO LARGE LINEAR ANALOG SYSTEMS / Iuculano G.; Liberatore A.; Manetti S.; Marini M.. - In: IEEE TRANSACTIONS ON CIRCUIT AND SYSTEMS. - ISSN 0098-4094. - STAMPA. - 33:(1986), pp. 644-648.
MULTIFREQUENCY MEASUREMENT OF TESTABILITY WITH APPLICATION TO LARGE LINEAR ANALOG SYSTEMS.
MANETTI, STEFANO;MARINI, MAURO
1986
Abstract
An algorithm is presented for measuring linear analog circuit testability. This algorithm is based on the testability measurement theory developed by N. Sen and R. Saeks (1979). It makes use of the classical modified nodal analysis method and can be combined with standard computer-aided-design algorithms. This approach is also suitable when automatically determining the optimal choice of test points at design phase time. It may serve as an aid in functional partitioning of the same system to facilitate testing and/or reduce computational complexity. An application to a classical active filter is given.
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