This work focuses on the assessment of noise parameters characterizing the hyperspectral images collected by a new generation high resolution sensor manufactured by Selex Galileo S.p.A., in Italy, and named Hyper SIM-GA, which is an imaging spectrometer operating in the push-broom configuration, with 512 bands (2 nm bandwidth) and 256 bands (6 nm bandwidth) in the V-NIR and SWIR wavelengths, respectively. To this purpose, an original method suitable for estimating the noise introduced by optical imaging systems is described. The power of the signal-dependent photonic noise is decoupled from that of the signal-independent noise generated by the electronic circuitry. The method relies on the multivariate regression of local sample mean and variance. Statistically homogeneous pixels produce scatter-points that are clustered along a straight line, whose slope and intercept measure the signal-dependent and the signal-independent components of the noise power, respectively. Experimental results on radiance data acquired by SIM-GA, highlight the accuracy of the proposed method and its robustness to image textures that may lead to a gross overestimation of the noise.
Quality assessment of data products from a new generation airborne imaging spectrometer / Alparone L.; Selva M.; Capobianco L.; Moretti S.; Chiarantini L.; Butera F.. - STAMPA. - 4:(2009), pp. 2802-2805. (Intervento presentato al convegno International Geoscience and Remote Sensing Symposium, IGARSS 2009 tenutosi a Cape Town, South Africa nel 12-17 July 2009) [10.1109/IGARSS.2009.5417403].
Quality assessment of data products from a new generation airborne imaging spectrometer
ALPARONE, LUCIANO;MORETTI, SANDRO;
2009
Abstract
This work focuses on the assessment of noise parameters characterizing the hyperspectral images collected by a new generation high resolution sensor manufactured by Selex Galileo S.p.A., in Italy, and named Hyper SIM-GA, which is an imaging spectrometer operating in the push-broom configuration, with 512 bands (2 nm bandwidth) and 256 bands (6 nm bandwidth) in the V-NIR and SWIR wavelengths, respectively. To this purpose, an original method suitable for estimating the noise introduced by optical imaging systems is described. The power of the signal-dependent photonic noise is decoupled from that of the signal-independent noise generated by the electronic circuitry. The method relies on the multivariate regression of local sample mean and variance. Statistically homogeneous pixels produce scatter-points that are clustered along a straight line, whose slope and intercept measure the signal-dependent and the signal-independent components of the noise power, respectively. Experimental results on radiance data acquired by SIM-GA, highlight the accuracy of the proposed method and its robustness to image textures that may lead to a gross overestimation of the noise.File | Dimensione | Formato | |
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