The breakdown performance of CMS barrel module prototype detectors and test devices with single and multi-guard structures were studied before and after neutron irradiation up to 2.10(14) 1 MeV equivalent neutrons. Before irradiation avalanche breakdown occurred at the guard ring implant edges. We measured 100-300 V higher breakdown voltage values for the devices with multi-guard than for devices with single-guard ring. After irradiation and type inversion the breakdown was smoother than before irradiation and the breakdown voltage value increased to 500-600 V for most of the devices.

High-voltage breakdown studies on Si microstrip detectors / S. Albergo, M. M. Angarano, P. Azzi, E. Babucci, N. Bacchetta, A. Bader, G. Bagliesi, A. Basti, U. Biggeri, G. M. Bilei, D. Bisello, D. Boemi, F. Bosi, L. Borrello, C. Bozzi, S. Braibant, H. Breuker, M. Bruzzi, A. Buffini, S. Busoni, et al.. - In: NUOVO CIMENTO. A. - ISSN 0369-3546. - ELETTRONICO. - 112:(1999), pp. 1271-1283.

High-voltage breakdown studies on Si microstrip detectors

BRUZZI, MARA;D'ALESSANDRO, RAFFAELLO;FOCARDI, ETTORE;
1999

Abstract

The breakdown performance of CMS barrel module prototype detectors and test devices with single and multi-guard structures were studied before and after neutron irradiation up to 2.10(14) 1 MeV equivalent neutrons. Before irradiation avalanche breakdown occurred at the guard ring implant edges. We measured 100-300 V higher breakdown voltage values for the devices with multi-guard than for devices with single-guard ring. After irradiation and type inversion the breakdown was smoother than before irradiation and the breakdown voltage value increased to 500-600 V for most of the devices.
1999
112
1271
1283
S. Albergo;M. M. Angarano;P. Azzi;E. Babucci;N. Bacchetta;A. Bader;G. Bagliesi;A. Basti;U. Biggeri;G. M. Bilei;D. Bisello;D. Boemi;F. Bos...espandi
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/775464
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