The first application of a thinned back-illuminated ion-implanted and laser annealed cco as a detector for extreme ultraviolet spectroscopy is described. The observed stigmatic spectra are in the 40-70 nm region and are produced by the excitation of some noble gases in an open hollow cathode source installed in a normal incidence toroidal grating spectrograph. The results are compared with spectra obtained by other detector systems applied to the same instrumentation, showing that the ceo offers a much greater detection capability than a system using a converting scintillator and a comparable one with respect to a photon counting detector.

Performances of a thinned back-illuminated ion-implanted CCD as detector for a normal incidence EUV spectrograph Measurement / Naletto, G.; Pace, Emanuele; Tondello, G.; Boscolo, A.. - In: MEASUREMENT SCIENCE & TECHNOLOGY. - ISSN 0957-0233. - STAMPA. - 5:(1994), pp. 1491-1500. [10.1088/0957-0233/5/12/010]

Performances of a thinned back-illuminated ion-implanted CCD as detector for a normal incidence EUV spectrograph Measurement

PACE, EMANUELE;
1994

Abstract

The first application of a thinned back-illuminated ion-implanted and laser annealed cco as a detector for extreme ultraviolet spectroscopy is described. The observed stigmatic spectra are in the 40-70 nm region and are produced by the excitation of some noble gases in an open hollow cathode source installed in a normal incidence toroidal grating spectrograph. The results are compared with spectra obtained by other detector systems applied to the same instrumentation, showing that the ceo offers a much greater detection capability than a system using a converting scintillator and a comparable one with respect to a photon counting detector.
1994
5
1491
1500
Naletto, G.; Pace, Emanuele; Tondello, G.; Boscolo, A.
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/776470
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