Thick epitaxial multilayer silicene films with a √3 ×√3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.

24 h stability of thick multilayer silicene in air / Paola De Padova; Carlo Ottaviani; Claudio Quaresima; Bruno Olivieri; Patrizia Imperatori; Eric Salomon; Thierry Angot; Lucia Quagliano; Claudia Romano; Alessandro Vona; Maurizio Muniz-Miranda; Amanda Generosi; Barbara Paci; Guy Le Lay. - In: 2D MATERIALS. - ISSN 2053-1583. - ELETTRONICO. - (2014), pp. x-x. [10.1088/2053-1583/1/2/021003]

24 h stability of thick multilayer silicene in air

MUNIZ-MIRANDA, MAURIZIO;
2014

Abstract

Thick epitaxial multilayer silicene films with a √3 ×√3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.
2014
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x
Paola De Padova; Carlo Ottaviani; Claudio Quaresima; Bruno Olivieri; Patrizia Imperatori; Eric Salomon; Thierry Angot; Lucia Quagliano; Claudia Romano; Alessandro Vona; Maurizio Muniz-Miranda; Amanda Generosi; Barbara Paci; Guy Le Lay
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/888734
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