Thick epitaxial multilayer silicene films with a √3 ×√3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.
24 h stability of thick multilayer silicene in air / Paola De Padova, Carlo Ottaviani, Claudio Quaresima, Bruno Olivieri, Patrizia Imperatori, Eric Salomon, Thierry Angot, Lucia Quagliano, Claudia Romano, Alessandro Vona, Maurizio Muniz-Miranda, Amanda Generosi, Barbara Paci, Guy Le Lay. - In: 2D MATERIALS. - ISSN 2053-1583. - ELETTRONICO. - (2014), pp. x-x. [10.1088/2053-1583/1/2/021003]
24 h stability of thick multilayer silicene in air
MUNIZ-MIRANDA, MAURIZIO;
2014
Abstract
Thick epitaxial multilayer silicene films with a √3 ×√3R(30°) surface structure show only mild surface oxidation after 24 h in air, as measured by Auger electron spectroscopy. X-ray diffraction and Raman spectroscopy measurements performed in air without any protective capping, as well as, for comparison, with a thin Al2O3 cap, showed the (002) reflection and the G, D and 2D Raman structures, which are unique fingerprints of thick multilayer silicene.
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