This research faces the problem of disturbance induced by high energy particles on electronic devices. Based on detailed analysis of this phenomenon, the work is divided into two parts: in the first part testing of the Single Event Upset (SEU) has been carried out with the aim of determining diagnostic techniques and the mitigation of this disturbance, taking into account the fact that testing is one of the fundamental points in electronic programmable devices; in the second part a fault tolerant technique has been devised so as to achieve the requirements demanded on a real avionic system.

Fault tolerant techniques to diagnose and mitigate Single Event Upset (SEU) effects on electronic programmable devices / L. Ciani;M. Catelani;L. Veltroni. - STAMPA. - (2008), pp. 794-798. (Intervento presentato al convegno 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session tenutosi a Florence, Italy nel 2008).

Fault tolerant techniques to diagnose and mitigate Single Event Upset (SEU) effects on electronic programmable devices

CIANI, LORENZO;CATELANI, MARCANTONIO;
2008

Abstract

This research faces the problem of disturbance induced by high energy particles on electronic devices. Based on detailed analysis of this phenomenon, the work is divided into two parts: in the first part testing of the Single Event Upset (SEU) has been carried out with the aim of determining diagnostic techniques and the mitigation of this disturbance, taking into account the fact that testing is one of the fundamental points in electronic programmable devices; in the second part a fault tolerant technique has been devised so as to achieve the requirements demanded on a real avionic system.
2008
Proceedings of 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session
16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session
Florence, Italy
2008
L. Ciani;M. Catelani;L. Veltroni
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/893526
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