Electrolytic capacitors are widely used in several power electronic systems. Their high energy density (J/cm3) features make them an attractive candidate for smoothing voltage ripple in supply circuitry. However, electrolytic capacitors have the shortest life span of components in power electronic circuits, usually due to their wear-out failure. The main wear-out mechanisms in electrolytic capacitors are the loss of the electrolyte by vapor diffusion trough the seals and the deterioration of the electrolyte. In this paper, a corrective model for reliability prediction is presented. This model is employed satisfactorily to estimate lifetime duration according to manufacturers' tests. An implementation of this method is proposed, which can be very helpful for predicting the capacitor reliability and alerting plant operators to execute maintenance and/or replacement of the component. Copyright�� (2014) by the International Measurement Confederation (IMEKO).
Electrolytic capacitor lifetime prediction in ground mobile applications / M. Catelani;L. Ciani;R. Singuaroli;A. Mannucci. - STAMPA. - (2014), pp. 164-168. (Intervento presentato al convegno 13th IMEKO TC10 Workshop on Technical Diagnostics 2014: Advanced Measurement Tools in Technical Diagnostics for Systems' Reliability and Safety tenutosi a Warsaw (Poland) nel 2014).
Electrolytic capacitor lifetime prediction in ground mobile applications
CATELANI, MARCANTONIO;CIANI, LORENZO;R. Singuaroli;
2014
Abstract
Electrolytic capacitors are widely used in several power electronic systems. Their high energy density (J/cm3) features make them an attractive candidate for smoothing voltage ripple in supply circuitry. However, electrolytic capacitors have the shortest life span of components in power electronic circuits, usually due to their wear-out failure. The main wear-out mechanisms in electrolytic capacitors are the loss of the electrolyte by vapor diffusion trough the seals and the deterioration of the electrolyte. In this paper, a corrective model for reliability prediction is presented. This model is employed satisfactorily to estimate lifetime duration according to manufacturers' tests. An implementation of this method is proposed, which can be very helpful for predicting the capacitor reliability and alerting plant operators to execute maintenance and/or replacement of the component. Copyright�� (2014) by the International Measurement Confederation (IMEKO).I documenti in FLORE sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.