Metal sulfides semiconductors with technological application in the photovoltaic field were prepared by electrodeposition With the aim of performing a structural characterization of the grown films, SXRD (Surface X-Ray Diffraction) investigations for the structural information, were undertaken.

An in situ SXRD study of CuxSz and Cux-ZnySk thin films prepared by Electrochemical Atomic Layer Depostion (E-ALD) / Serena Cinotti; Francesco Di benedetto; Alessndro Lavacchi; Andrea Giaccherini; Giordano Montegrossi; Annalisa Guerri; Francesco Carlà; Roberto Felici; Massimo Innocenti. - ELETTRONICO. - (2015), pp. 0-0. (Intervento presentato al convegno Nano and dispersion coatings. European interfinish 2015).

An in situ SXRD study of CuxSz and Cux-ZnySk thin films prepared by Electrochemical Atomic Layer Depostion (E-ALD)

CINOTTI, SERENA;DI BENEDETTO, FRANCESCO;LAVACCHI, ALESSANDRO;GIACCHERINI, ANDREA;GUERRI, ANNALISA;CARLA', FRANCESCO;INNOCENTI, MASSIMO
2015

Abstract

Metal sulfides semiconductors with technological application in the photovoltaic field were prepared by electrodeposition With the aim of performing a structural characterization of the grown films, SXRD (Surface X-Ray Diffraction) investigations for the structural information, were undertaken.
2015
Nano and dispersion coatings. European interfinish 2015
Nano and dispersion coatings. European interfinish 2015
Serena Cinotti; Francesco Di benedetto; Alessndro Lavacchi; Andrea Giaccherini; Giordano Montegrossi; Annalisa Guerri; Francesco Carlà; Roberto Felici...espandi
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/983591
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