Metal sulfides semiconductors with technological application in the photovoltaic field were prepared by electrodeposition With the aim of performing a structural characterization of the grown films, SXRD (Surface X-Ray Diffraction) investigations for the structural information, were undertaken.
An in situ SXRD study of CuxSz and Cux-ZnySk thin films prepared by Electrochemical Atomic Layer Depostion (E-ALD) / Serena Cinotti; Francesco Di benedetto; Alessndro Lavacchi; Andrea Giaccherini; Giordano Montegrossi; Annalisa Guerri; Francesco Carlà; Roberto Felici; Massimo Innocenti. - ELETTRONICO. - (2015), pp. 0-0. (Intervento presentato al convegno Nano and dispersion coatings. European interfinish 2015).
An in situ SXRD study of CuxSz and Cux-ZnySk thin films prepared by Electrochemical Atomic Layer Depostion (E-ALD)
CINOTTI, SERENA;DI BENEDETTO, FRANCESCO;LAVACCHI, ALESSANDRO;GIACCHERINI, ANDREA;GUERRI, ANNALISA;CARLA', FRANCESCO;INNOCENTI, MASSIMO
2015
Abstract
Metal sulfides semiconductors with technological application in the photovoltaic field were prepared by electrodeposition With the aim of performing a structural characterization of the grown films, SXRD (Surface X-Ray Diffraction) investigations for the structural information, were undertaken.
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