RESISTIVE MAGNETOHYDRODYNAMICS SIMULATIONS OF THE IDEAL TEARING MODE

We study the linear and nonlinear evolution of the tearing instability on thin current sheets by means of twodimensional numerical simulations, within the framework of compressible, resistive MHD. In particular we analyze the behavior of current sheets whose inverse aspect ratio scales with the Lundquist number S as S-1 3. This scaling has been recently recognized to yield the threshold separating fast, ideal reconnection, with an evolution and growth that are independent of S provided this is high enough, as it should be natural having the ideal case as a limit for S -> ∞. Our simulations confirm that the tearing instability growth rate can be as fast as 0.6 A 1 g » tA,where tA is the ideal Alfvénic time set by the macroscopic scales, for our least diffusive case with S 10 = 7. The expected instability dispersion relation and eigenmodes are also retrieved in the linear regime, for the values of S explored here. Moreover, in the nonlinear stage of the simulations we observe secondary events obeying the same critical scaling with S, here calculated on the local, much smaller lengths, leading to increasingly faster reconnection. These findings strongly support the idea that in a fully dynamic regime, as soon as current sheets develop, thin, and reach this critical threshold in their aspect ratio, the tearing mode is able to trigger plasmoid formation and reconnection on the local (ideal) Alfvénic timescales, as required to explain the explosive flaring activity often observed in solar and astrophysical plasmas.