Hall effect analysis in irradiated silicon samples with different resistivities

The changes induced by neutron irradiation in n- and p-type silicon samples with starting resistivities from 10 Omega-cm up to 30 K Omega-cm, grown, using different techniques, as Float-Zone (FZ), Czochralski (CZ) and epitaxial, have been analyzed by Van der Pauw and Hall effect measurements. Increasing the fluence, each set of samples evolves toward a quasi-intrinsic p-type material. This behavior has been explained in the frame of a two-level model, that considers the introduction during irradiation of mainly two defects. A deep acceptor and a deep donor,probably related to the divacancy and to the CiOi complex, are placed in the upper and lower half of the forbidden gap, respectively. This simple model explains quantitatively the data on resistivity and Hall coefficient of each set of samples up to the fluence of approximate to 10(14) n/cm(2).