BORCHI, EMILIO

BORCHI, EMILIO  

ENERGETICA 'SERGIO STECCO' (attivo dal 01/08/1980 al 31/12/2012)  

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Risultati 1 - 20 di 117 (tempo di esecuzione: 0.05 secondi).
Titolo Data di pubblicazione Autore(i) File
A comparative study of the thermoluminescent response to beta irradiation of CVD diamond and LiF dosimeters 1997 F. BOGANI; E. BORCHI; M. BRUZZI; C. LEROY AND S. SCIORTINO
A CVD Diamond Beam Telescope for Charged Particle Tracking 2002 W. Adam; E. Berdermann; P. Bergonzo; W. de Boer; F. Bogani; E. Borchi; A. Brambilla; M. Bruzzi; C. Colledani; J. Conway; P. D’Angelo; W. Dabrowski; P. Delpierre; W. Dulinski; J. Doroshenko; M. Doucet; B. van Eijk; A. Fallou; P. Fischer; F. Fizzotti; D. Kania; K. K. Gan; E. Grigoriev; G. Hallewell; S. Han; F. Hartjes; J. Hrubec; D. Husson; H. Kagan; J. Kaplon; R. Kass; M. Keil; K. T. Knöpfle; T. Koeth; M. Krammer; S. Meuser; A. Logiudice; L. mac Lynne; C. Manfredotti; D. Meier; D. Menichelli; M. Mishina; L. Moroni; J. Noomen; A. Oh; L. S. Pan; M. Pernicka; L. Perera; J. L. Riester; S. Roe; A. Rudge; J. Russ; S. Sala; M. Sampietro; S. Schnetzer; S. Sciortino; H. Stelzer; R. Stone; B. Suter; W. Trischuk; D. Tromson; E. Vittone; P. Weilhammer; N. Wermes; M. Wetstein; W. Zeuner; M. Zoeller
A method of TSC analysis of shallow levels applied to silicon 1998 E Borchi;M Bruzzi;S Pirollo;S Sciortino
A note on the ultrasonic velocities in higly oriented austenitic weld materials 1984 E. Biagi; E. Borchi; S. Frosini
A phenomenological model for the macroscopic characteristics of irradiated silicon 1996 E. Borchi;M. Bruzzi;U. Biggeri;S. Lazanu
A study of charge collection processes on polycrystalline diamond detectors 2004 S. MERSI; E. BORCHI; M. BRUZZI; R. D'ALESSANDRO; S. LAGOMARSINO; S. SCIORTINO
A two-level model for heavily irradiated silicon detectors 1999 E Borchi;M Bruzzi;Z Li;S Pirollo
Analysis of Non-Exponential Thermally Stimulated Currents for Heavily Doped Silicon Diodes 1995 E.BORCHI; M. BRUZZI
Antichi elettrometri e galvanometri. 1992 E. Biagi; E. Borchi
Change in surface morphology of diamond films deposited by DC plasma glow discharge CVD 1997 T. Bacci; E. Borchi; M. Bruzzi; M. Santoro; S. Sciortino
Characterisation of SiC photo-detectors for solar UV radiation monitoring 2011 E. Borchi;R. Macii;M. Bruzzi;M. Scaringella
Characterization of diamond detectors prepared by DC plasma glow discharge CVD 1998 E. Borchi;M. Bruzzi;D. Meier;S. Pirollo;M. Santoro;S. Sciortino
Charge collection and noise analysis of heavily irradiated silicon detectors 1998 E.BORCHI; M. BRUZZI; C.LEROY; S.PIROLLO; S.SCIORTINO
Charge collection efficiency of irradiated silicon detector operated at cryogenic temperatures 2000 K. Borer;S. Janos;V.G. Palmieri;B. Dezillie;Z. Li;P. Collins;T.O. Niinikoski;C. Lourenço;P. Sonderegger;E. Borchi;M. Bruzzi;S. Pirollo;V. Granata;S. Pagano;S. Chapuy;Z. Dimcovski;E. Grigoriev;W. Bell;S.R.H. Devine;V. O'Shea;K. Smith;P. Berglund;W. de Boer;F. Hauler;S. Heising;L. Jungermann;L. Casagrande;V. Cindro;M. Mikuž;M. Zavartanik;C. da Viá;A. Esposito;I. Konorov;S. Paul;L. Schmitt;S. Buontempo;N. D'Ambrosio;S. Pagano;G. Ruggiero;V. Eremin;E. Verbitskaya
Comparative study of heavily irradiated silicon and non irradiated SI LEC GaAs detectors 1998 U. Biggeri; E. Borchi; M. Bruzzi; V. Eremin; C. Leroy; Z. Li; D. Menichelli; S. Pirollo; S. Sciortino; E. Verbitskaya
Comparison of radiation damage in silicon detectors induced by pions, protons and neutrons 1996 U. Biggeri;E. Borchi;M. Bruzzi;A. Candelori;A. Giraldo
Correlated analysis of deep level transient spectroscopy and thermally stimulated current spectra 2003 David Menichelli; Emilio Borchi
Correlation between material properties and leakage currents in CVD diamond films deposited by DC plasma glow discharge 1997 T. Bacci; E. Borchi; M. Bruzzi; M. Santoro; S. Sciortino
Cryogenic Si detectors for ultra radiation hardness in SLHC environment 2007 Zheng Li; M. Abreu; P. Anbinderis; T. Anbinderis; N.D'. Ambrosio; W. de Boer; E. Borchi; K. Borer; M. Bruzzi; S. Buontempo; W. Chen; V. Cindro; A. Dierlamm; V. Eremin; E. Gaubas; V. Gorbatenko; E. Grigoriev; F. Hauler; E. Heijne; S. Heising; O. Hempel; R. Herzog; J. Harkonen; I. Ilyashenko; S. Janos; L. Jungermann; V. Kalesinskas; J. Kapturauskas; R. Laiho; P. Luukka; I. Mandic; Rita De Masi; D. Menichelli; M. Mikuz; O. Militaru; T.O. Niinikosky; V.O'. Shea; S. Pagano; S. Paul; K. Piotrzkowski; K. Pretzl; P. Rato Mendes; X. Rouby; G. Ruggiero; K. Smith; P. Sonderegger; P. Sousa; E. Tuominen; E. Tuovinen; E. Verbitskaya; J. Vaitkus; E. Wobst; M. Zavrtanik
Cryogenic technology for tracking detectors 2001 V. Granata;C. da Viá;S. Watts;K. Borer;S. Janos;K. Pretzl;B. Dezillie;Z. Li;L. Casagrande;P. Collins;S. Grohmann;E. Heijne;C. Lourenço;T.O. Niinikoski;V.G. Palmieri;P. Sonderegger;E. Borchi;M. Bruzzi;S. Pirollo;S. Chapuy;Z. Dimcovski;E. Grigoriev;W. Bell;S.R.H. Devine;V. O’Shea;G. Ruggiero;K. Smith;P. Berglund;W. de Boer;F. Hauler;S. Heising;L. Jungermann;M. Abreu;P. Rato Mendes;P. Sousa;V. Cindro;M. Mikuz;M. Zavrtanik;A. Esposito;I. Konorov;S. Paul;S. Buontempo;N. D’Ambrosio;S. Pagano;V. Eremin;E. Verbitskaya