Prediction of machined surface error in peripheral milling is a non-trivial problem. The complexity in milling arises due to discontinuous cutting forces causing forced vibration of both workpiece and tool, even in stable cutting condition. In the presence of run-out, the situation is further complicated owing to changing radii of cutting points. The present research attempts to model the milled surface topography and roughness, considering the dynamic behavior of both workpiece and tool, and the tooth trajectories interaction, complicated by the presence of run-out. A time domain numerical model, which includes cutter-workpiece engagements and instantaneous uncut chip area, is presented. Experiments have been also carried out to verify the simulation results

Milled surface generation model for time domain simulation / A. Scippa; N. Grossi; A. Velenosi; G. Campatelli. - ELETTRONICO. - (2013), pp. 0-0. (Intervento presentato al convegno MTTRF 2013 Annual Meeting tenutosi a San Francisco, CA, USA nel June 30th - July 2nd).

Milled surface generation model for time domain simulation

SCIPPA, ANTONIO;GROSSI, NICCOLO';VELENOSI, ALESSANDRO;CAMPATELLI, GIANNI
2013

Abstract

Prediction of machined surface error in peripheral milling is a non-trivial problem. The complexity in milling arises due to discontinuous cutting forces causing forced vibration of both workpiece and tool, even in stable cutting condition. In the presence of run-out, the situation is further complicated owing to changing radii of cutting points. The present research attempts to model the milled surface topography and roughness, considering the dynamic behavior of both workpiece and tool, and the tooth trajectories interaction, complicated by the presence of run-out. A time domain numerical model, which includes cutter-workpiece engagements and instantaneous uncut chip area, is presented. Experiments have been also carried out to verify the simulation results
2013
Proceedings of the MTTRF annual meeting 2013
MTTRF 2013 Annual Meeting
San Francisco, CA, USA
June 30th - July 2nd
A. Scippa; N. Grossi; A. Velenosi; G. Campatelli
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Utilizza questo identificatore per citare o creare un link a questa risorsa: https://hdl.handle.net/2158/827419
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